Diffraction and Related
S.A. Chambers, G.A. Howell, T.R. Greenlee, and J.H. Weaver, "Characterization of Intermixing in Metal- Semiconductor Interfaces by Means of Angle-Resolved Auger Electron Emission: Cu/Si(111)7x7," Phys. Rev. B 31, 6402-6410 (1985).
S.A. Chambers, T.R. Greenlee, G.A. Howell, and J.H. Weaver, "Quantitative Interdiffusion Studies of Noble Metal/Si(111)-7x7 Interfaces by Angle-Resolved Auger Electron Emission," J. Vac. Sci. Technol. A 3, 1291-1294 (1985).
S.A. Chambers, S.B. Anderson, and J.H. Weaver, "Atomic Structure of the Cu/Si (111) Interface by High-Energy Core-Level Auger Electron Diffraction," Phys. Rev. B 32, 581- 587 (1985).
S.A. Chambers, T.R. Greenlee, C.P. Smith, and J.H. Weaver, "Quantitative Characterization of Abrupt Interfaces by Angle-Resolved Auger Emission," Phys. Rev. B Rapid Commun. 32, 4245-4248 (1985).
S.A. Chambers, S.B. Anderson, and J.H. Weaver, "Structural Characterization of Metal/Metal Interfaces by Intermediate-Energy Auger Electron Diffraction," Phys. Rev. B 32, 4872-4875 (1985).
M. del Giudice, M. Grioni, J.J. Joyce, M.W. Ruckman, S.A. Chambers, and J.H. Weaver, "Modeling Homogeneous and Heterogeneous Metal/Semiconductor Interface Reactions with Photoemission and Angle Resolved Auger Spectroscopies," Surf. Sci. 168, 309-322 (1986).
S.A. Chambers, S.B. Anderson, and J.H. Weaver, "Surface Structural Determination of Metal/Semiconductor Interfaces by Angle-Resolved Auger Electron Emission," Appl. Surf. Sci. 26, 542-549 (1986).
S.A. Chambers, H.-W. Chen, I.M. Vitomirov, S.B. Anderson, and J.H. Weaver, "Direct Observation of Elastic Strain and Relaxation at a Metal/Metal Interface By Auger Electron Diffraction: Cu/Ni(001)," Phys. Rev. Rapid Commun. B 33, 8810-8813 (1986).
S.A. Chambers, H.-W. Chen, S.B. Anderson, and J.H. Weaver, "Incident Beam Effects in Angle-Resolved Auger Electron Spectroscopy," Phys. Rev. B 34, 3055-3059 (1986).
S.A. Chambers, S.B. Anderson, H.-W. Chen, and J.H. Weaver, "High-Temperature Nucleation and Silicide Formation at the Co/Si(111)-7x7 Interface - A Structural Study," Phys. Rev. B 34, 913-920 (1986).
S.A. Chambers, I.M. Vitomirov, S.B. Anderson, and J.H. Weaver, "Medium-Energy Backscattered Electron Diffraction as a Probe of Elastic Strain in Epitaxial Overlayers," Phys. Rev. Rapid Commun. B 35, 2490-2493 (1987).
S.A. Chambers, S.B. Anderson, H.-W. Chen, and J.H. Weaver, "Growth of Metastable fcc Co on Ni(001)," Phys. Rev. B 35, 2592-2597 (1987).
S.A. Chambers, I.M. Vitomirov, and J.H. Weaver, "Incident Beam Effects in Medium- Energy Backscattered Electron Diffraction," Phys. Rev. B 36, 3007-3014 (1987).
S.A. Chambers, T.J. Wagener, and J.H. Weaver, "Formation and Structure of Fe/Cu(00l) Interfaces, Sandwiches, and Superlattices," Phys. Rev. B 36, 8992-9002 (1987).
S.A. Chambers, I.M. Vitomirov, S.B. Anderson, H.-W. Chen, T.J. Wagener, and J.H. Weaver, "High-Energy Auger and Medium-Energy Backscattered Electron Diffraction as a Probe of Ultra-Thin Epitaxial Overlayers, Sandwiches, and Superlattices," Superlattices and Microstructures 3, 563-571 (1987).
P.J. Benning, F. Stepniak, and J.H. Weaver, "Electron Diffraction and Photoelectron Spectroscopy Studies of Fullerene and Alkali-Metal Fulleride Films," Phys. Rev. B 48, 9086-9096 (1993).