Metal-metal Interfaces


D.G. O'Neill, J.J. Joyce, T.W. Capehart, and J.H. Weaver, "Evolution of the Bulk Electronic Structure of Ag on Pd(100)," J. Vac. Sci. Technol. A 3, 1639-1640 (1985).

S.A. Chambers, T.R. Greenlee, C.P. Smith, and J.H. Weaver, "Quantitative Characterization of Abrupt Interfaces by Angle-Resolved Auger Emission," Phys. Rev. B Rapid Commun. 32, 4245-4248 (1985).

S.A. Chambers, S.B. Anderson, and J.H. Weaver, "Structural Characterization of Metal/Metal Interfaces by Intermediate-Energy Auger Electron Diffraction," Phys. Rev. B 32, 4872-4875 (1985).

S.A. Chambers, H.-W. Chen, I.M. Vitomirov, S.B. Anderson, and J.H. Weaver, "Direct Observation of Elastic Strain and Relaxation at a Metal/Metal Interface by Auger Electron Diffraction: Cu/Ni(001)," Phys. Rev. Rapid Commun. B 33, 8810-8813 (1986).

S.A. Chambers, I.M. Vitomirov, S.B. Anderson, and J.H. Weaver, "Medium-Energy Backscattered Electron Diffraction as a Probe of Elastic Strain in Epitaxial Overlayers," Phys. Rev. Rapid Commun. B 35, 2490-2493 (1987).

S.A. Chambers, S.B. Anderson, H.-W. Chen, and J.H. Weaver, "Growth of Metastable fcc Co on Ni(001)," Phys. Rev. B 35, 2592-2597 (1987).

D.G. O'Neill and J.H. Weaver, "Evolution of a Surface State into an Interface State: A Probe of the Buried Epitaxial Cr/Au(100) Interface," Phys. Rev. Rapid Commun. B 35, 5892-5895 (1987).

S.A. Chambers, T.J. Wagener, and J.H. Weaver, "Formation and Structure of Fe/Cu(00l) Interfaces, Sandwiches, and Superlattices," Phys. Rev. B 36, 8992-9002 (1987).

S.A. Chambers, I.M. Vitomirov, S.B. Anderson, H.-W. Chen, T.J. Wagener, and J.H. Weaver, "High-energy Auger and Medium-Energy Backscattered Electron Diffraction as a Probe of Ultra-thin Epitaxial Overlayers, Sandwiches, and Superlattices," Superlattices and Microstructures 3, 563-571 (1987).

D.G. O'Neill and J.H. Weaver, "Evolution of the Electronic Structure of the Cr/Au(001) Interface," Phys. Rev. B 37, 8122-8129 (1988).

D.G. O'Neill and J.H. Weaver, "Two-Dimensional Energy Bands for Cr/Au(001)," J. Vac. Sci. Technol. A 6, 582-584 (1988).

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